Control charts are widely used in industry to monitor processes
that are far from Zero-Defect (ZD), and their use in a near
Zero-Defect manufacturing environment poses many problems. This
book presents techniques of using control charts for high-quality
processes, and some recent findings and applications of statistical
control chart techniques for ZD processes are presented.
A powerful technique based on counting of the cumulative
conforming (CCC) items between two nonconforming ones is discussed
in detail. Extensions of the CCC chart are described, as well as
applications of cumulative sum and exponentially weighted moving
average techniques to CCC-related data, multivariate methods,
economic design of control chart procedures, and modeling and
analysis of trended but regularly adjusted processes.
Many examples, charts, and procedures, are presented throughout
the book, and references are provided for those interested in
exploring the details. A number of questions and issues are posed
for further investigations. Researchers and students may find many
ideas in this book useful in their academic work, as a foundation
is laid for the exploration of many further theoretical and
practical issues.
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