"Advances in Imaging and Electron Physics "merges two
long-running serials--"Advances in Electronics and Electron
Physics" and "Advances in Optical and Electron Microscopy."
This series features extended articles on the physics of
electron devices (especially semiconductor devices), particle
optics at high and low energies, microlithography, image science
and digital image processing, electromagnetic wave propagation,
electron microscopy, and the computing methods used in all these
domains.
Key features:
* Contributions from leading authorities * Informs and updates
on all the latest developments in the field
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