Nanometer-scale Defect Detection Using Polarized Light (Hardcover)

This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Combining experimental techniques of polarized light analysis with techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbon nanotube properties. The combination of theory and pratical methods presented throughout this book provide the reader with an insight into the current understanding of physicochemical processes affecting the properties of materials at the nanoscale.

General

Imprint:	Iste Ltd And John Wiley & Sons Inc
Country of origin:	United Kingdom
Release date:	August 2016
Authors:	Pr Dahoo
Dimensions:	241 x 167 x 24mm (L x W x T)
Format:	Hardcover
Pages:	316
ISBN-13:	978-1-84821-936-6
Categories:	Books > Professional & Technical > Technology: general issues > Nanotechnology Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials > General Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Applied optics > General Promotions
LSN:	1-84821-936-9
Barcode:	9781848219366

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