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Bringing Scanning Probe Microscopy up to Speed (Paperback, Softcover reprint of the original 1st ed. 1999) Loot Price: R2,754
Discovery Miles 27 540
Bringing Scanning Probe Microscopy up to Speed (Paperback, Softcover reprint of the original 1st ed. 1999): Stephen C. Minne,...

Bringing Scanning Probe Microscopy up to Speed (Paperback, Softcover reprint of the original 1st ed. 1999)

Stephen C. Minne, Scott R. Manalis, Calvin F Quate

Series: Microsystems, 3

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Loot Price R2,754 Discovery Miles 27 540 | Repayment Terms: R258 pm x 12*

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Bringing Scanning Probe Microscopy Up to Speed introduces the principles of scanning probe systems with particular emphasis on techniques for increasing speed. The authors include useful information on the characteristics and limitations of current state-of-the-art machines as well as the properties of the systems that will follow in the future. The basic approach is two-fold. First, fast scanning systems for single probes are treated and, second, systems with multiple probes operating in parallel are presented. The key components of the SPM are the mechanical microcantilever with integrated tip and the systems used to measure its deflection. In essence, the entire apparatus is devoted to moving the tip over a surface with a well-controlled force. The mechanical response of the actuator that governs the force is of the utmost importance since it determines the scanning speed. The mechanical response relates directly to the size of the actuator; smaller is faster. Traditional scanning probe microscopes rely on piezoelectric tubes of centimeter size to move the probe. In future scanning probe systems, the large actuators will be replaced with cantilevers where the actuators are integrated on the beam. These will be combined in arrays of multiple cantilevers with MEMS as the key technology for the fabrication process.

General

Imprint: Springer-Verlag New York
Country of origin: United States
Series: Microsystems, 3
Release date: February 2013
First published: 1999
Authors: Stephen C. Minne • Scott R. Manalis • Calvin F Quate
Dimensions: 235 x 155 x 10mm (L x W x T)
Format: Paperback
Pages: 159
Edition: Softcover reprint of the original 1st ed. 1999
ISBN-13: 978-1-4613-7353-7
Categories: Books > Professional & Technical > Energy technology & engineering > Electrical engineering > General
Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials > General
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > General
LSN: 1-4613-7353-0
Barcode: 9781461373537

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