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Nondestructive Evaluation of Materials - Sagamore Army Materials Research Conference Proceedings 23 (Paperback, Softcover reprint of the original 1st ed. 1979) Loot Price: R1,616
Discovery Miles 16 160
Nondestructive Evaluation of Materials - Sagamore Army Materials Research Conference Proceedings 23 (Paperback, Softcover...

Nondestructive Evaluation of Materials - Sagamore Army Materials Research Conference Proceedings 23 (Paperback, Softcover reprint of the original 1st ed. 1979)

Volker Weiss, John J. Burke

Series: Sagamore Army Materials Research Conference Proceedings, 23

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Loot Price R1,616 Discovery Miles 16 160 | Repayment Terms: R151 pm x 12*

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The Army Materials and Mechanics Research Center of Water town, Massachusetts in cooperation with the Materials Science Group of the Department of Chemical Engineering and Materials Science of Syracuse University has conducted the Sagamore Army Materials Research Conference since 1954. The main purpose of these conferences has been to gather together over 150 scientists and engineers from academic institutions, industry and government who are uniquely qualified to explore in depth a subject of importance to the Department of Defense, the Army and the scientific community. This volume NONDESTRUCTIVE EVALUATION OF MATERIALS, addresses the areas of x-ray, ultrasonics and other methods of nondestructive testing. We wish to acknowledge the dedicated assistance of Joseph M. Bernier of the Army Materials and Mechanics Research Center and Helen Brown DeMascio of Syracuse University throughout the stages of the conference planning and finally the publication of this book. Their help is deeply appreciated. Syracuse University Syracuse, New York The Editors Contents SESSION I X-RAY S. Heissman, Moderator H. K. Herglotz, Moderator 1. Overview of X-Ray Diffraction Methods for Nondestructive Testing * * * * * * * *** 1 L. V. Azaroff 2. Detection of Fatigue Damage by X-Rays 21 S. Taira and K. Kamachi 3. A Historical Example of Fatigue Damage * * * * * * * 55 H. K. Herglotz 4. The Application of X-Ray Topography to Materials Science . . . . . . . . . . . . . . . . . . . . 69 S. Weissman 5.

General

Imprint: Springer-Verlag New York
Country of origin: United States
Series: Sagamore Army Materials Research Conference Proceedings, 23
Release date: December 2012
First published: 1979
Authors: Volker Weiss • John J. Burke
Dimensions: 244 x 170 x 28mm (L x W x T)
Format: Paperback
Pages: 530
Edition: Softcover reprint of the original 1st ed. 1979
ISBN-13: 978-1-4613-2954-1
Categories: Books > Science & Mathematics > Physics > General
Books > Professional & Technical > Technology: general issues > Nanotechnology
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LSN: 1-4613-2954-X
Barcode: 9781461329541

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