Generally it is not sufficiently appreciated that electron
microscopy is in fact a diffraction method. In essential aspects
electron microscopes are more closely related to X-ray diffracto-
meters than to light microscopes. In electron microscopes
monochromatized radiation and coherent illumination (never used in
light microscopy) correspond in X-ray diffractometers to the
primary beam with a small divergence. Imaging ina general sense can
take place in interference experiments between a primary beam and a
scattered beam, or between diffe- rent deflected scattered beams.
This leads to the realization of an old dream in diffracto- metry,
namely to a general experimental solution of the "phase problem".
The most im- pressive analogy, however, concerns the potential of
the electron microscope as a tool for structure determination
(where the radiation wavelenght is smaller than the atomic distan-
ces). It was therefore considered timely to treat this topic in
this series. It was a fortunate cioncidence that in 1976 a Workshop
on "Unconventional Electron Microscope Methods for the
Investigation of Molecular Structures" (sponsored by the European
Molecular Biology Organisation, the Deutsche Forschungsgemeinschaft
and the Max-Planck-Gesell- schaft) took place, and that most
speakers presenting introductory lectures agreed to publish their
contributions in an expanded version in this volume. This volume is
thus not a symposium report in the usual sense since it contains
the majority of these introductory lectures only.
General
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