Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces (Paperback, 2011 ed.)

This thesis presents results from a combined atomic-resolution Z-contrast and annular bright-field imaging and electron energy loss spectroscopy in the Scanning Transmission Electron Microscopy, as well as first principles studies of the interfaces between crystalline Si3N4 and amorphous (i) CeO2-x as well as (ii) SiO2 intergranular film (IGF). These interfaces are of a great fundamental and technological interest because they play an important role in the microstructural evolution and mechanical properties of Si3N4 ceramics used in many high temperature and pressure applications. The main contribution of this work is its detailed description of the bonding characteristics of light atoms, in particular oxygen and nitrogen, at these interfaces, which has not been achieved before. The atomic-scale information on the arrangement of both light and heavy atoms is critical for realistic modeling of interface properties, such as interface strength and ion transport, and will facilitate increased control over the performance of ceramic and semiconductor materials for a wide-range of applications.

General

Imprint:	Springer-Verlag New York
Country of origin:	United States
Series:	Springer Theses
Release date:	May 2013
First published:	2011
Authors:	Weronika Walkosz
Dimensions:	235 x 155 x 6mm (L x W x T)
Format:	Paperback
Pages:	110
Edition:	2011 ed.
ISBN-13:	978-1-4614-2857-2
Categories:	Books > Science & Mathematics > Chemistry > Physical chemistry > General Books > Professional & Technical > Industrial chemistry & manufacturing technologies > Industrial chemistry > Chemical engineering Books > Science & Mathematics > Chemistry > Analytical chemistry > Qualitative analytical chemistry > Chemical spectroscopy, spectrochemistry > General Promotions
LSN:	1-4614-2857-2
Barcode:	9781461428572

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