Progress in Transmission Electron Microscopy 2 - Applications in Materials Science (Paperback, Softcover reprint of hardcover 1st ed. 2001)

Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume II illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.

General

Imprint:	Springer-Verlag
Country of origin:	Germany
Series:	Springer Series in Surface Sciences, 39
Release date:	October 2010
First published:	2001
Editors:	Xiaofeng Zhang • Ze Zhang
Dimensions:	235 x 155 x 17mm (L x W x T)
Format:	Paperback
Pages:	307
Edition:	Softcover reprint of hardcover 1st ed. 2001
ISBN-13:	978-3-642-08718-9
Categories:	Books > Science & Mathematics > Science: general issues > Scientific standards Books > Professional & Technical > Technology: general issues > Nanotechnology Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials > General
LSN:	3-642-08718-3
Barcode:	9783642087189

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