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Metrology and Diagnostic Techniques for Nanoelectronics (Hardcover)
Loot Price: R10,226
Discovery Miles 102 260
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Metrology and Diagnostic Techniques for Nanoelectronics (Hardcover)
Expected to ship within 12 - 17 working days
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Nanoelectronics is changing the way the world communicates, and is
transforming our daily lives. Continuing Moore's law and
miniaturization of low-power semiconductor chips with
ever-increasing functionality have been relentlessly driving
R&D of new devices, materials, and process capabilities to meet
performance, power, and cost requirements. This book covers
up-to-date advances in research and industry practices in
nanometrology, critical for continuing technology scaling and
product innovation. It holistically approaches the subject matter
and addresses emerging and important topics in semiconductor
R&D and manufacturing. It is a complete guide for metrology and
diagnostic techniques essential for process technology, electronics
packaging, and product development and debugging-a unique approach
compared to other books. The authors are from academia, government
labs, and industry and have vast experience and expertise in the
topics presented. The book is intended for all those involved in IC
manufacturing and nanoelectronics and for those studying
nanoelectronics process and assembly technologies or working in
device testing, characterization, and diagnostic techniques.
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