Structure of Metals GRYSTALLOGRAPHIG METHODS, PRINCIPLES, AND - DATA BY CHARLES H. BARRETT, PH. D. Associate Professor of Metallurgical Engineering and Member of Staff of the Metals Research Laboratory Carnegie Institute of Technology FIRST EDITION F 1 FT 1 1 I M PRESS ION MoGBAW-HILL BOOK COMPANY, INC. NEW YORK AND LONDON 1943 STRUCTURE OF MKTALS COPYRIGHT. 1943, BY THE MrGRAW-HiLL BOOK COMPANY, INC. PRINTED IK THB UNITED STATES OF AMERICA All rights reserved. This book, or parts thereof, may not be reproduced in any form without permission of the publishers. PREFACE This book is intended to serve both as a text and as a reference book. The portions intended for classroom use have been written for courses in crystallography, particularly the courses offered to students of metallurgy. It is primarily intended for graduate courses, but a number of chapters are at a level appropriate for advanced undergraduate courses in applied x-rays, crystallography, and physical metallurgy Chaps. I to IV, IX to XI, XIII. In an effort to make the book more readable, certain advanced topics on x-ray diffraction and various tables of data have been placed in appendixes, and laboratory manipulations that would not interest the general reader have been printed in smaller type. The first four chapters of this book explain the fundamentals of crystal lattices and projections, and the general principles of the diffrac tion of x-rays from Crystals. Chapters V to VII cover the technique of x-ray diffraction, presenting the operating details of the methods that are in common use. Several chapters are included on the applica tions of x-ray diffraction in the field of physical metallurgy, covering techniques fordetermining constitution diagrams, identifying unknown materials, determining crystal structures, determining the orientation of single crystals, detecting and analyzing preferred orientations, and measuring stresses. One chapter is devoted to electron diffraction, its metallurgical uses, and the precautions to be observed in interpreting electron diffrac tion data. The electron microscope receives only a brief mention because at the time the manuscript was written the metallographic technique for this instrument was still being rapidly developed and, except for particle-size determinations, the instrument had not yet achieved the status of a widely accepted tool in metallographic or crystallographic research. The last half of the book is devoted to the results of research and contains extensive reviews of fields that are of current interest. In assembling these summaries, an effort has been made to include an ade quate number of references to the literature, to cover thoroughly the subjects that have not been extensively reviewed in readily available publications, and to maintain a critical but unbiased attitude toward the data and conclusions that are reviewed. The subjects treated include the following principles governing the crystal structure of metals and vi PREPACK alloys supcrlattices and their effect on properties imperfections in crystals the structure of liquid metals the processes of slip, twinning, and fracture and modern theories of these processes, including the cur rent dislocation theory the effects of cold work and annealing on the structure of metals, including the effects on diffraction patterns of static and fatigue stressing, rolling, grinding, and polishing theresults of x-ray studies of internal stresses preferred orientations resulting from cold work, hot work, recrystallization, freezing, electrodeposition, evapora tion, and sputtering directionality in commercial products and in single crystals and its relation to crystal orientation. The author is indebted to many colleagues and graduate students who have assisted directly and indirectly in the preparation of this book. He particularly wishes to thank Dr. R. F...

Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.

The 37th Annual Denver Conference on Applications of X-Ray Analysis was held August 1-5, 1988, at the Sheraton Steamboat Resort and Conference Center, Steamboat Springs, Colorado. As usual, alternating with x-ray diffraction, the emphasis this year was x-ray fluorescence, but as has been the pattern for several occasions over the last few years, the Plenary Session did not deal with that subject, specifically. In an attempt to introduce the audience to one of the new developments in x-ray analysis, the title of the session was "High Brilliance Sources/Applications," and dealt exclusively with synchrotron radiation, a topic which has made a very large impact on the x-ray community over the last decade. As the organizer and co-chairman of the Plenary Session (with Paul Predecki), it is my responsibility to report on that session here. The Conference had the privilege of obtaining the services of some of the preeminent practitioners of research using this remarkable x-ray source; they presented the audience with unusually lucid descriptions of the work which has been accomplished in the development and application of the continuous, high intensity, tunable, polarized and collimated x-rays available from no facility other than these specialized storage rings. The opening lecture (and I use that term intentionally) was an enthusiastic description of "What is Synchrotron Radiation?" by Professor Boris Batterman of Cornell University and the Cornell High Energy Synchrotron Sourc(! (CHESS).

The 37th Annual Denver Conference on Applications of X-Ray Analysis was held August 1-5, 1988, at the Sheraton Steamboat Resort and Conference Center, Steamboat Springs, Colorado. As usual, alternating with x-ray diffraction, the emphasis this year was x-ray fluorescence, but as has been the pattern for several occasions over the last few years, the Plenary Session did not deal with that subject, specifically. In an attempt to introduce the audience to one of the new developments in x-ray analysis, the title of the session was "High Brilliance Sources/Applications," and dealt exclusively with synchrotron radiation, a topic which has made a very large impact on the x-ray community over the last decade. As the organizer and co-chairman of the Plenary Session (with Paul Predecki), it is my responsibility to report on that session here. The Conference had the privilege of obtaining the services of some of the preeminent practitioners of research using this remarkable x-ray source; they presented the audience with unusually lucid descriptions of the work which has been accomplished in the development and application of the continuous, high intensity, tunable, polarized and collimated x-rays available from no facility other than these specialized storage rings. The opening lecture (and I use that term intentionally) was an enthusiastic description of "What is Synchrotron Radiation?" by Professor Boris Batterman of Cornell University and the Cornell High Energy Synchrotron Sourc(! (CHESS).

The 37th Annual Denver Conference on Applications of X-Ray Analysis was held August 1-5, 1988, at the Sheraton Steamboat Resort and Conference Center, Steamboat Springs, Colorado. As usual, alternating with x-ray diffraction, the emphasis this year was x-ray fluorescence, but as has been the pattern for several occasions over the last few years, the Plenary Session did not deal with that subject, specifically. In an attempt to introduce the audience to one of the new developments in x-ray analysis, the title of the session was "High Brilliance Sources/Applications," and dealt exclusively with synchrotron radiation, a topic which has made a very large impact on the x-ray community over the last decade. As the organizer and co-chairman of the Plenary Session (with Paul Predecki), it is my responsibility to report on that session here. The Conference had the privilege of obtaining the services of some of the preeminent practitioners of research using this remarkable x-ray source; they presented the audience with unusually lucid descriptions of the work which has been accomplished in the development and application of the continuous, high intensity, tunable, polarized and collimated x-rays available from no facility other than these specialized storage rings. The opening lecture (and I use that term intentionally) was an enthusiastic description of "What is Synchrotron Radiation?" by Professor Boris Batterman of Cornell University and the Cornell High Energy Synchrotron Sourc(! (CHESS).

The University of Denver and its staff members deserve much credit for organizing and operating this Denver X-ray Conference year after year, for there seems to be no doubt that it and the yolumes that result from it are filling a need. The interests covered by the papers at one of these conferences vary from year to year and as a whole cover a wide spread of topics. This is as it should be. Old problems that have been with us for many years are being attacked again with new and more effective tools, new problems are continually arising, and new methods of great power are being developed. These developments are occurring in each of the fields covered, as may readily be seen by a glance at this twelfth volume and other recent volumes of this series. It seems clear that the policy of having these conferences and these volumes cover a wide field rather than a single one such as, for example, structure determination, or fluorescence analysis, is a policy that meets with general approval and should be continued. I understand there is every intention to do so. C. S. Barrett It is customary to acknowledge in each volume the invited session chairmen of the three-day meeting. They and the sessions at which they presided (21-23 August 1968) were as follows: CRYSTALLOGRAPHY AND DIFFRACTION. C. S. Barrett, University of Chicago, Chicago, Illinois. METHODS AND THEIR APPLICATIONS. B. C. Giessen, Massachusetts Institute of Technology, Cambridge, Massachusetts.

The 35th Annual Denver Conference on Applications of X-Ray Analysis was held August 4-8, 1986, on the campus of the University of Denver. Since the previous year's conference had emphasized x-ray diffraction, this year the Plenary Session spotlighted x-ray fluorescence, with the title "Trends in XRF: A World Perspective," featuring renowned speakers from three major areas. XRF IN NORTH AMERICA, by Prof. D. E. Leydon, from Colorado State University, dealt specifically with developments in the fields of instrumentation, data treatment and applications in that part of the world. Prof. H. Ebel, from the Technical University of Vienna, discussed XRF IN EUROPE, concentrating on subjects including total reflection, improved fundamental parameters, quantitation without standards and imaging techniques. Tomoya Arai, of the Rigaku Industrial Corporation in Japan, in considering XRF IN THE FAR EAST, described the scientific activity in XRF and the applications thereof, primarily in Japan and China. These plenary lectures were interspersed with short discussions of PERSONAL OBSERVATIONS on the subject by the co-chairmen of the SeSSion, Ron Jenkins and myself. The intent of this session was to bring the audience up-to-date on the status of the field in various parts of the world, and to give some feeling concerning where it is likely to go in the immediate future. Hopefully, the publication of the written versions of those presentations in this volume will make the authors' thoughts available to many who could not be present at the conference.

The continuing success of the Denver X-Ray Conference is, it seems to me, the consequence of three equally important facets of each meeting. These are: 1) the collegial atmosphere and workshops at which experts and novices mix, talk, and informally share information at many levels; 2) the plenary session at which information is presented that intentionally brings new ideas to attendees to broaden the scope of the field; and 3) the traditional sessions in which interesting reports on current research and applications are presented in a timely and professional way. The first and last of these are discussed separately by Paul Predecki and are organized (no small task ) by the entire advisory board. This requires much more than deciding whether yet another workshop on specimen preparation is needed and whom to prevail upon to organize and present it. In fact, few attendees at these workshops ever appreciate the level of effort that Paul and his staff expend to make sure everything comes off smoothly, even when hundreds of copies of handouts need to be whipped off at the last moment, travel problems arise, or unusual audio visual aids are suddenly needed. But my topic here is the second of the three facets listed above - the plenary session. Organizing this falls to a single individual, on the theory that one person can then approach enough others as speakers to put together a unified and yet diverse program of related and interesting review papers."

The 33rd Annual Denver Conference on Applications of X-Ray Analysis was held July 30-August 3. 1984. on the campus of the University of Denver. Following the recent tradition of alternating plenary lecture topics between X-ray diffraction and X-ray fluorescence at the confer ence. the plenary sessions dealt with topics of X-ray fluorescence. Prof. H. Aiginger presented a plenary lect re on TOTAL REFLECTANCE X-RAY SPECTROMETRY which admirably described this relatively new technique. J. C. Russ discussed XRF AND OTHER SURFACE ANALYTICAL TECHNIQUES which gave an excellent overview of the role XRF plays in a modern analytical laboratory. J. E. Taggart. Jr. described THE ROLE OF XRF IN A MODERN GEOCHEMICAL LABORATORY and presented many case histories of the configura tion of analytical equipment in several geochemical laboratories. The plenary lectures demonstrated both the dynamic nature of research in X-ray fluorescence. and the important role X-ray spectrom etry plays in the arsenal of analytical methods found in modern labora tories. Total reflectance X-ray spectrometry takes advantage of con sideration of the geometry of the X-ray optics. Potentially. new sample types may be considered as X-ray fluorescence specimens using this technique."

Structure of Metals GRYSTALLOGRAPHIG METHODS, PRINCIPLES, AND - DATA BY CHARLES H. BARRETT, PH. D. Associate Professor of Metallurgical Engineering and Member of Staff of the Metals Research Laboratory Carnegie Institute of Technology FIRST EDITION F 1 FT 1 1 I M PRESS ION MoGBAW-HILL BOOK COMPANY, INC. NEW YORK AND LONDON 1943 STRUCTURE OF MKTALS COPYRIGHT. 1943, BY THE MrGRAW-HiLL BOOK COMPANY, INC. PRINTED IK THB UNITED STATES OF AMERICA All rights reserved. This book, or parts thereof, may not be reproduced in any form without permission of the publishers. PREFACE This book is intended to serve both as a text and as a reference book. The portions intended for classroom use have been written for courses in crystallography, particularly the courses offered to students of metallurgy. It is primarily intended for graduate courses, but a number of chapters are at a level appropriate for advanced undergraduate courses in applied x-rays, crystallography, and physical metallurgy Chaps. I to IV, IX to XI, XIII. In an effort to make the book more readable, certain advanced topics on x-ray diffraction and various tables of data have been placed in appendixes, and laboratory manipulations that would not interest the general reader have been printed in smaller type. The first four chapters of this book explain the fundamentals of crystal lattices and projections, and the general principles of the diffrac tion of x-rays from Crystals. Chapters V to VII cover the technique of x-ray diffraction, presenting the operating details of the methods that are in common use. Several chapters are included on the applica tions of x-ray diffraction in the field of physical metallurgy, covering techniques fordetermining constitution diagrams, identifying unknown materials, determining crystal structures, determining the orientation of single crystals, detecting and analyzing preferred orientations, and measuring stresses. One chapter is devoted to electron diffraction, its metallurgical uses, and the precautions to be observed in interpreting electron diffrac tion data. The electron microscope receives only a brief mention because at the time the manuscript was written the metallographic technique for this instrument was still being rapidly developed and, except for particle-size determinations, the instrument had not yet achieved the status of a widely accepted tool in metallographic or crystallographic research. The last half of the book is devoted to the results of research and contains extensive reviews of fields that are of current interest. In assembling these summaries, an effort has been made to include an ade quate number of references to the literature, to cover thoroughly the subjects that have not been extensively reviewed in readily available publications, and to maintain a critical but unbiased attitude toward the data and conclusions that are reviewed. The subjects treated include the following principles governing the crystal structure of metals and vi PREPACK alloys supcrlattices and their effect on properties imperfections in crystals the structure of liquid metals the processes of slip, twinning, and fracture and modern theories of these processes, including the cur rent dislocation theory the effects of cold work and annealing on the structure of metals, including the effects on diffraction patterns of static and fatigue stressing, rolling, grinding, and polishing theresults of x-ray studies of internal stresses preferred orientations resulting from cold work, hot work, recrystallization, freezing, electrodeposition, evapora tion, and sputtering directionality in commercial products and in single crystals and its relation to crystal orientation. The author is indebted to many colleagues and graduate students who have assisted directly and indirectly in the preparation of this book. He particularly wishes to thank Dr. R. F...