0
Your cart

Your cart is empty

Books > Science & Mathematics > Physics > States of matter > Condensed matter physics (liquids & solids)

Buy Now

Ion Spectroscopies for Surface Analysis (Paperback, Softcover reprint of the original 1st ed. 1991) Loot Price: R1,520
Discovery Miles 15 200
Ion Spectroscopies for Surface Analysis (Paperback, Softcover reprint of the original 1st ed. 1991): Alvin W. Czanderna, David...

Ion Spectroscopies for Surface Analysis (Paperback, Softcover reprint of the original 1st ed. 1991)

Alvin W. Czanderna, David M. Hercules

Series: Methods of Surface Characterization, 2

 (sign in to rate)
Loot Price R1,520 Discovery Miles 15 200 | Repayment Terms: R142 pm x 12*

Bookmark and Share

Expected to ship within 10 - 15 working days

Determining the elemental composition of surfaces is an essential measurement in characterizing solid surfaces. At present, many ap proaches may be applied for measuring the elemental and molecular composition of a surface. Each method has particular strengths and limitations that often are directly connected to the physical processes involved. Typically, atoms and molecules on the surface and in the near surface region may be excited by photons, electrons, ions, or neutrals, and the detected particles are emitted, ejected, or scattered ions or electrons. The purpose of this book is to bring together a discussion of the surface compositional analysis that depends on detecting scattered or sputtered ions, and the methods emphasized are those where instruments are commercially available for carrying out the analysis. For each topic treated, the physical principles, instrumentation, qualitative analysis, artifacts, quantitative analysis, applications, opportunities, and limita tions are discussed. The first chapter provides an overview of the role of elemental composition in surface science; compositional depth profiling; stimulation by an electric field, electrons, neutrals, or photons and detection of ions; and then stimulation by ions, and detection of ions, electrons, photons, or neutrals."

General

Imprint: Springer-Verlag New York
Country of origin: United States
Series: Methods of Surface Characterization, 2
Release date: March 2013
First published: 1991
Editors: Alvin W. Czanderna • David M. Hercules
Dimensions: 229 x 152 x 25mm (L x W x T)
Format: Paperback
Pages: 469
Edition: Softcover reprint of the original 1st ed. 1991
ISBN-13: 978-1-4613-6649-2
Categories: Books > Science & Mathematics > Physics > States of matter > Condensed matter physics (liquids & solids)
Books > Science & Mathematics > Chemistry > Physical chemistry > General
Books > Science & Mathematics > Chemistry > Analytical chemistry > Qualitative analytical chemistry > Chemical spectroscopy, spectrochemistry > General
LSN: 1-4613-6649-6
Barcode: 9781461366492

Is the information for this product incomplete, wrong or inappropriate? Let us know about it.

Does this product have an incorrect or missing image? Send us a new image.

Is this product missing categories? Add more categories.

Review This Product

No reviews yet - be the first to create one!

Partners