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Applied Scanning Probe Methods III - Characterization (Hardcover, 2006 ed.)
Loot Price: R4,296
Discovery Miles 42 960
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Applied Scanning Probe Methods III - Characterization (Hardcover, 2006 ed.)
Series: NanoScience and Technology
Expected to ship within 10 - 15 working days
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Total price: R4,316
Discovery Miles: 43 160
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The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a
new era in imaging. The sc- ning probes emerged as a new i- trument
for imaging with a pre- sion suf?cient to delineate single atoms.
At ?rst there were two - the Scanning Tunneling Microscope, or STM,
and the Atomic Force Mic- scope, or AFM. The STM relies on
electrons tunneling between tip and sample whereas the AFM depends
on the force acting on the tip when it was placed near the sample.
These were quickly followed by the - gneticForceMicroscope,MFM,and
the Electrostatic Force Microscope, EFM. The MFM will image a
single magnetic bit with features as small as 10nm. With the EFM
one can monitor the charge of a single electron. Prof. Paul Hansma
at Santa Barbara opened the door even wider when he was able to
image biological objects in aqueous environments. At this point the
sluice gates were opened and a multitude of different instruments
appeared. There are signi?cant differences between the Scanning
Probe Microscopes or SPM, and others such as the Scanning Electron
Microscope or SEM. The probe microscopes do not require preparation
of the sample and they operate in ambient atmosphere, whereas, the
SEM must operate in a vacuum environment and the sample must be
cross-sectioned to expose the proper surface. However, the SEM can
record 3D image and movies, features that are not available with
the scanning probes.
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