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Books > Science & Mathematics > Science: general issues > Scientific equipment & techniques, laboratory equipment > Microscopy

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Applied Scanning Probe Methods IX - Characterization (Hardcover, 2008 ed.) Loot Price: R4,423

Discovery Miles 44 230

Repayment Terms: R415 pm x 12*

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Applied Scanning Probe Methods IX - Characterization (Hardcover, 2008 ed.): Bharat Bhushan, Harald Fuchs, Masahiko Tomitori

Applied Scanning Probe Methods IX - Characterization (Hardcover, 2008 ed.)

Bharat Bhushan, Harald Fuchs, Masahiko Tomitori

Series: NanoScience and Technology

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Loot Price R4,423 Discovery Miles 44 230 | Repayment Terms: R415 pm x 12*

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The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely and comprehensive overview of SPM applications.

General

Imprint:	Springer-Verlag
Country of origin:	Germany
Series:	NanoScience and Technology
Release date:	2008
First published:	2008
Editors:	Bharat Bhushan • Harald Fuchs • Masahiko Tomitori
Dimensions:	235 x 155 x 21mm (L x W x T)
Format:	Hardcover
Pages:	387
Edition:	2008 ed.
ISBN-13:	978-3-540-74082-7
Categories:	Books > Professional & Technical > Technology: general issues > Nanotechnology Books > Science & Mathematics > Science: general issues > Scientific equipment & techniques, laboratory equipment > Microscopy Promotions
LSN:	3-540-74082-1
Barcode:	9783540740827