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Books > Science & Mathematics > Science: general issues > Scientific equipment & techniques, laboratory equipment > Microscopy

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Applied Scanning Probe Methods VI - Characterization (Hardcover, 2007 ed.) Loot Price: R4,393
Discovery Miles 43 930
Applied Scanning Probe Methods VI - Characterization (Hardcover, 2007 ed.): Bharat Bhushan, Satoshi Kawata

Applied Scanning Probe Methods VI - Characterization (Hardcover, 2007 ed.)

Bharat Bhushan, Satoshi Kawata

Series: NanoScience and Technology

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Loot Price R4,393 Discovery Miles 43 930 | Repayment Terms: R412 pm x 12*

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The first volume in the series was released in January 2004 and the second to fourth volumes in early 2006. The field is now progressing so fast that there is a need for one volume every 12 to 18 months to capture latest developments.

Volume VI presents 10 chapters on a variety of new and emerging techniques and refinements of SPM applications.

General

Imprint: Springer-Verlag
Country of origin: Germany
Series: NanoScience and Technology
Release date: October 2006
First published: 2007
Editors: Bharat Bhushan • Satoshi Kawata
Dimensions: 235 x 155 x 19mm (L x W x T)
Format: Hardcover
Pages: 338
Edition: 2007 ed.
ISBN-13: 978-3-540-37318-6
Categories: Books > Science & Mathematics > Science: general issues > Scientific equipment & techniques, laboratory equipment > Microscopy
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LSN: 3-540-37318-7
Barcode: 9783540373186

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