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Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections (Paperback, 2011 ed.) Loot Price: R2,979
Discovery Miles 29 790
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections (Paperback, 2011 ed.): Cher Ming Tan,...

Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections (Paperback, 2011 ed.)

Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou

Series: Springer Series in Reliability Engineering

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Loot Price R2,979 Discovery Miles 29 790 | Repayment Terms: R279 pm x 12*

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"Applications of Finite Element Methods for Reliability Studies" on ULSI Interconnections provides a detailed description of the application of finite element methods (FEMs) to the study of ULSI interconnect reliability. Over the past two decades the application of FEMs has become widespread and continues to lead to a much better understanding of reliability physics.

To help readers cope with the increasing sophistication of FEMs applications to interconnect reliability, "Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections" will: introduce the principle of FEMs;review numerical modeling of ULSI interconnect reliability;describe the physical mechanism of ULSI interconnect reliability encountered in the electronics industry; anddiscuss in detail the use of FEMs to understand and improve ULSI interconnect reliability from both the physical and practical perspective, incorporating the Monte Carlo method.

A full-scale review of the numerical modeling methodology used in the study of interconnect reliability highlights useful and noteworthy techniques that have been developed recently. Many illustrations are used throughout the book to improve the reader s understanding of the methodology and its verification. Actual experimental results and micrographs on ULSI interconnects are also included.

"Applications of Finite Element Methods for Reliability Studies" on ULSI Interconnections is a good reference for researchers who are working on interconnect reliability modeling, as well as for those who want to know more about FEMs for reliability applications. It gives readers a thorough understanding of the applications of FEM to reliability modeling and an appreciation of the strengths and weaknesses of various numerical models for interconnect reliability."

General

Imprint: Springer London
Country of origin: United Kingdom
Series: Springer Series in Reliability Engineering
Release date: April 2013
First published: 2011
Authors: Cher Ming Tan • Wei Li • Zhenghao Gan • Yuejin Hou
Dimensions: 235 x 155 x 10mm (L x W x T)
Format: Paperback
Pages: 152
Edition: 2011 ed.
ISBN-13: 978-1-4471-2641-6
Categories: Books > Science & Mathematics > Mathematics > Calculus & mathematical analysis > Differential equations
Books > Professional & Technical > Mechanical engineering & materials > Production engineering > Industrial quality control
Books > Professional & Technical > Mechanical engineering & materials > Production engineering > Reliability engineering
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > General
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LSN: 1-4471-2641-6
Barcode: 9781447126416

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