"Applications of Finite Element Methods for Reliability Studies"
on ULSI Interconnections provides a detailed description of the
application of finite element methods (FEMs) to the study of ULSI
interconnect reliability. Over the past two decades the application
of FEMs has become widespread and continues to lead to a much
better understanding of reliability physics.
To help readers cope with the increasing sophistication of FEMs
applications to interconnect reliability, "Applications of Finite
Element Methods for Reliability Studies on ULSI Interconnections"
will: introduce the principle of FEMs;review numerical modeling of
ULSI interconnect reliability;describe the physical mechanism of
ULSI interconnect reliability encountered in the electronics
industry; anddiscuss in detail the use of FEMs to understand and
improve ULSI interconnect reliability from both the physical and
practical perspective, incorporating the Monte Carlo method.
A full-scale review of the numerical modeling methodology used
in the study of interconnect reliability highlights useful and
noteworthy techniques that have been developed recently. Many
illustrations are used throughout the book to improve the reader s
understanding of the methodology and its verification. Actual
experimental results and micrographs on ULSI interconnects are also
included.
"Applications of Finite Element Methods for Reliability Studies"
on ULSI Interconnections is a good reference for researchers who
are working on interconnect reliability modeling, as well as for
those who want to know more about FEMs for reliability
applications. It gives readers a thorough understanding of the
applications of FEM to reliability modeling and an appreciation of
the strengths and weaknesses of various numerical models for
interconnect reliability."
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