Analytical Electron Microscopy for Materials Science (Paperback, 2002 ed.)

Analytical electron microscopy is one of the most powerful tools today for characterization of the advanced materials that support the nanotechnology of the twenty-first century. In this book the authors clearly explain both the basic principles and the latest developments in the field. In addition to a fundamental description of the inelastic scattering process, an explanation of the constituent hardware is provided. Standard quantitative analytical techniques employing electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy are also explained, along with elemental mapping techniques. Included are sections on convergent beam electron diffraction and electron holography utilizing the field emission gun. With generous use of illustrations and experimental data, this book is a valuable resource for anyone concerned with materials characterization, electron microscopy, materials science, crystallography, and instrumentation.

General

Imprint:	Springer Verlag,Japan
Country of origin:	Japan
Release date:	September 2002
First published:	September 2002
Authors:	Daisuke Shindo • T. Oikawa
Dimensions:	279 x 210 x 10mm (L x W x T)
Format:	Paperback
Pages:	152
Edition:	2002 ed.
ISBN-13:	978-4-431-70336-5
Categories:	Books > Science & Mathematics > Science: general issues > Scientific equipment & techniques, laboratory equipment > Microscopy Promotions
LSN:	4-431-70336-5
Barcode:	9784431703365

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