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X-Ray Microscopy II - Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987 (Paperback, Softcover reprint of the original 1st ed. 1988) Loot Price: R1,567
Discovery Miles 15 670
X-Ray Microscopy II - Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987 (Paperback,...

X-Ray Microscopy II - Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987 (Paperback, Softcover reprint of the original 1st ed. 1988)

David Sayre, Malcolm Howells, Janos Kirz, Harvey Rarback

Series: Springer Series in Optical Sciences, 56

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Loot Price R1,567 Discovery Miles 15 670 | Repayment Terms: R147 pm x 12*

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This volume is based on papers presented at the International Symposium on X-Ray Microscopy held at Brookhaven National Laboratory, Upton NY, August 31-September 4, 1987. Previous recent symposia on the sub ject were held in New York in 1979, Gottingen in 1983 and Taipei in 1986. Developments in x-ray microscopy continue at a rapid pace, with im portant advances in all major areas: x-ray sources, optics and components, and microscopes and imaging systems. Taken as a whole, the work pre sented here emphasizes three major directions: (a) improvements in the capability and image-quality of x-ray microscopy, expressed principally in systems attached to large, high-brightness x-ray sources; (b) greater access to x-ray microscopy, expressed chiefly in systems employing small, often pulsed, x-ray sources; and (c) increased rate of exploration of applications of x-ray microscopy. The number of papers presented at the symposium has roughly dou bled compared with that of its predecessors. While we are delighted at this growth as a manifestation of vitality and rapid growth of the field, we did have to ask the authors to limit the length of their papers and to submit them in camera-ready form. We thank the authors for their con tributions and for their efforts in adhering to the guidelines on manuscript preparation.

General

Imprint: Springer-Verlag
Country of origin: Germany
Series: Springer Series in Optical Sciences, 56
Release date: October 2013
First published: 1988
Editors: David Sayre • Malcolm Howells • Janos Kirz • Harvey Rarback
Dimensions: 229 x 152 x 24mm (L x W x T)
Format: Paperback
Pages: 455
Edition: Softcover reprint of the original 1st ed. 1988
ISBN-13: 978-3-662-14490-9
Categories: Books > Science & Mathematics > Science: general issues > Scientific equipment & techniques, laboratory equipment > Microscopy
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LSN: 3-662-14490-5
Barcode: 9783662144909

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