Acoustic Scanning Probe Microscopy (Hardcover, 2013 ed.)

The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive review of different scanning probe acoustic techniques, including AFAM, UAFM, SNFUH, UFM, SMM and torsional tapping modes. Basic theoretical explanations are given to understand not only the probe dynamics but also the dynamics of tip surface contacts. Calibration and enhancement are discussed to better define the performance of the techniques, which are also compared with other classical techniques such as nanoindentation or surface acoustic wave. Different application fields are described, including biological surfaces, polymers and thin films.

General

Imprint:	Springer-Verlag
Country of origin:	Germany
Series:	NanoScience and Technology
Release date:	October 2012
First published:	2013
Editors:	Francesco Marinello • Daniele Passeri • Enrico Savio
Dimensions:	235 x 155 x 30mm (L x W x T)
Format:	Hardcover
Pages:	494
Edition:	2013 ed.
ISBN-13:	978-3-642-27493-0
Categories:	Books > Science & Mathematics > Science: general issues > Scientific equipment & techniques, laboratory equipment > Microscopy Promotions
LSN:	3-642-27493-5
Barcode:	9783642274930

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