Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching - Application to Rough and Natural Surfaces (Hardcover, 2006 ed.)

Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples.

General

Imprint:	Springer-Verlag
Country of origin:	Germany
Series:	NanoScience and Technology
Release date:	August 2006
First published:	2006
Authors:	Gerd Kaupp
Dimensions:	235 x 155 x 19mm (L x W x T)
Format:	Hardcover
Pages:	292
Edition:	2006 ed.
ISBN-13:	978-3-540-28405-5
Categories:	Books > Science & Mathematics > Science: general issues > Scientific equipment & techniques, laboratory equipment > Microscopy Promotions
LSN:	3-540-28405-2
Barcode:	9783540284055

Is the information for this product incomplete, wrong or inappropriate? Let us know about it.

Does this product have an incorrect or missing image? Send us a new image.

Is this product missing categories? Add more categories.

Review This Product

No reviews yet - be the first to create one!