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Books > Science & Mathematics > Science: general issues > Scientific equipment & techniques, laboratory equipment > Microscopy

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Practical Electron Microscopy Of Lattice Defects (Hardcover) Loot Price: R2,610
Discovery Miles 26 100
Practical Electron Microscopy Of Lattice Defects (Hardcover): Hiroyasu Saka

Practical Electron Microscopy Of Lattice Defects (Hardcover)

Hiroyasu Saka

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Loot Price R2,610 Discovery Miles 26 100 | Repayment Terms: R245 pm x 12*

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'Although the study of such defects is regularly examined at length in more general books on electron microscopy, this text in which they are centre-stage will surely be appreciated.' [Read Full Review]UltramicroscopyThis unique reference text provides those who are studying crystal lattice defects using a transmission electron microscope (TEM) with a basic knowledge of transmission electron microscopy. As it has been written for beginners, the principles of both transmission electron microscopy and crystallography have been clearly and simply explained, with the use of many figures and photographs to aid understanding. Mathematics is avoided where possible, and problems and exercises are amply provided.

General

Imprint: World Scientific Publishing Co Pte Ltd
Country of origin: Singapore
Release date: April 2021
First published: 2021
Authors: Hiroyasu Saka
Format: Hardcover
Pages: 308
ISBN-13: 978-981-12-3469-9
Categories: Books > Science & Mathematics > Science: general issues > Scientific equipment & techniques, laboratory equipment > Microscopy
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LSN: 981-12-3469-8
Barcode: 9789811234699

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