0
Your cart

Your cart is empty

Books > Science & Mathematics > Science: general issues > Scientific standards

Buy Now

Investigations on rf breakdown phenomenon in high gradient accelerating structures (Hardcover, 1st ed. 2018) Loot Price: R2,927
Discovery Miles 29 270
Investigations on rf breakdown phenomenon in high gradient accelerating structures (Hardcover, 1st ed. 2018): Jiahang Shao

Investigations on rf breakdown phenomenon in high gradient accelerating structures (Hardcover, 1st ed. 2018)

Jiahang Shao

Series: Springer Theses

 (sign in to rate)
Loot Price R2,927 Discovery Miles 29 270 | Repayment Terms: R274 pm x 12*

Bookmark and Share

Expected to ship within 10 - 15 working days

This book mainly focuses on the experimental research of rf breakdown and field emission with novel methods, including triggering rf breakdown with high intensity laser and pin-shaped cathodes as well as locating field emitters with a high resolution in-situ imaging system. With these methods, this book has analyzed the power flow between cells during rf breakdown, observed the evolution of field emission during rf conditioning and the dependence of field emission on stored energy, and studied the field emitter distribution and origination. The research findings greatly expand the understanding of rf breakdown and field emission, which will in turn benefit future study into electron sources, particle accelerators, and high gradient rf devices in general.

General

Imprint: Springer Verlag, Singapore
Country of origin: Singapore
Series: Springer Theses
Release date: 2018
First published: 2018
Authors: Jiahang Shao
Dimensions: 235 x 155mm (L x W)
Format: Hardcover
Pages: 131
Edition: 1st ed. 2018
ISBN-13: 978-981-10-7925-2
Categories: Books > Science & Mathematics > Science: general issues > Scientific standards
Books > Science & Mathematics > Physics > Particle & high-energy physics
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Microwave technology
Promotions
LSN: 981-10-7925-0
Barcode: 9789811079252

Is the information for this product incomplete, wrong or inappropriate? Let us know about it.

Does this product have an incorrect or missing image? Send us a new image.

Is this product missing categories? Add more categories.

Review This Product

No reviews yet - be the first to create one!

You might also like..

The History of Ancient Chinese Measures…
Qiu Guangming Hardcover R3,135 Discovery Miles 31 350
Key to the Hebrew-Egyptian Mystery in…
James Ral J Ralston (James Ralston) Hardcover R904 Discovery Miles 9 040
Applied Psychometry
Arun Kumar Singh Paperback R947 Discovery Miles 9 470
Lasers and Their Application in the…
Richard A. Dunlap Hardcover R3,371 Discovery Miles 33 710
Lasers and Their Application to the…
Richard A. Dunlap Hardcover R1,746 Discovery Miles 17 460
Mechanics of Biological Systems…
Seungman Park, Yun Chen Hardcover R1,892 Discovery Miles 18 920
Semiconductors and Modern Electronics
Charles Winrich Hardcover R1,515 Discovery Miles 15 150
Circular of the Bureau of Standards No…
Anonymous Hardcover R708 Discovery Miles 7 080
The Physics of Noise
Edoardo Milotti Hardcover R1,515 Discovery Miles 15 150
Reference Materials in Measurement and…
Sergey V. Medvedevskikh, Egor P. Sobina, … Hardcover R5,143 Discovery Miles 51 430
Measurement and Analysis of Human…
Vladimir Medved Hardcover R1,966 Discovery Miles 19 660
Plastic Scintillators - Chemistry and…
Matthieu Hamel Hardcover R3,825 Discovery Miles 38 250

See more

Partners