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Investigations on rf breakdown phenomenon in high gradient accelerating structures (Hardcover, 1st ed. 2018) Loot Price: R2,653
Discovery Miles 26 530
Repayment Terms: R249 pm x 12*
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Investigations on rf breakdown phenomenon in high gradient accelerating structures (Hardcover, 1st ed. 2018): Jiahang Shao

Investigations on rf breakdown phenomenon in high gradient accelerating structures (Hardcover, 1st ed. 2018)

Jiahang Shao

Series: Springer Theses

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Loot Price R2,653 Discovery Miles 26 530 | Repayment Terms: R249 pm x 12*

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This book mainly focuses on the experimental research of rf breakdown and field emission with novel methods, including triggering rf breakdown with high intensity laser and pin-shaped cathodes as well as locating field emitters with a high resolution in-situ imaging system. With these methods, this book has analyzed the power flow between cells during rf breakdown, observed the evolution of field emission during rf conditioning and the dependence of field emission on stored energy, and studied the field emitter distribution and origination. The research findings greatly expand the understanding of rf breakdown and field emission, which will in turn benefit future study into electron sources, particle accelerators, and high gradient rf devices in general.

General

Imprint: Springer Verlag, Singapore
Country of origin: Singapore
Series: Springer Theses
Release date: 2018
First published: 2018
Authors: Jiahang Shao
Dimensions: 235 x 155mm (L x W)
Format: Hardcover
Pages: 131
Edition: 1st ed. 2018
ISBN-13: 978-981-10-7925-2
Categories: Books > Science & Mathematics > Science: general issues > Scientific standards
Books > Science & Mathematics > Physics > Particle & high-energy physics
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Microwave technology
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LSN: 981-10-7925-0
Barcode: 9789811079252

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