A discussion of recently developed experimental methods for
noise research in nanoscale electronic devices, conducted by
specialists in transport and stochastic phenomena in nanoscale
physics. The approach described is to create methods for
experimental observations of noise sources, their localization and
their frequency spectrum, voltage-current and thermal dependences.
Our current knowledge of measurement methods for mesoscopic devices
is summarized to identify directions for future research, related
to downscaling effects.
The directions for future research into fluctuation phenomena in
quantum dot and quantum wire devices are specified. Nanoscale
electronic devices will be the basic components for electronics of
the 21st century. From this point of view the signal-to-noise ratio
is a very important parameter for the device application. Since the
noise is also a quality and reliability indicator, experimental
methods will have a wide application in the future.
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