Scanning Electron Microscopy and X-Ray Microanalysis - Third Edition (Paperback, 3rd ed. 2003. Softcover reprint of the original 3rd ed. 2003)

This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.

General

Imprint:	Springer-Verlag New York
Country of origin:	United States
Release date:	May 2013
First published:	2003
Authors:	Joseph Goldstein • Dale E. Newbury • David C. Joy • Charles E. Lyman • Patrick Echlin • Eric Lifshin • Linda Sawyer • J.R. Michael
Dimensions:	254 x 178 x 43mm (L x W x T)
Format:	Paperback
Pages:	689
Edition:	3rd ed. 2003. Softcover reprint of the original 3rd ed. 2003
ISBN-13:	978-1-4613-4969-3
Categories:	Books > Reference & Interdisciplinary > Interdisciplinary studies > General Books > Science & Mathematics > Biology, life sciences > General Books > Professional & Technical > Technology: general issues > Nanotechnology Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials > General
LSN:	1-4613-4969-9
Barcode:	9781461349693

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