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Books > Professional & Technical > Technology: general issues > Nanotechnology
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Scanning Electron Microscopy and X-Ray Microanalysis - Third Edition (Paperback, 3rd ed. 2003. Softcover reprint of the original 3rd ed. 2003)
Loot Price: R3,204
Discovery Miles 32 040
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Scanning Electron Microscopy and X-Ray Microanalysis - Third Edition (Paperback, 3rd ed. 2003. Softcover reprint of the original 3rd ed. 2003)
Expected to ship within 10 - 15 working days
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This text provides students as well as practitioners with a
comprehensive introduction to the field of scanning electron
microscopy (SEM) and X-ray microanalysis. The authors emphasize the
practical aspects of the techniques described. Topics discussed
include user-controlled functions of scanning electron microscopes
and x-ray spectrometers and the use of x-rays for qualitative and
quantitative analysis. Separate chapters cover SEM sample
preparation methods for hard materials, polymers, and biological
specimens. In addition techniques for the elimination of charging
in non-conducting specimens are detailed.
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