This fully illustrated text explains the basic measurement
techniques, describes the commercially available instruments and
provides an overview of the current perception of 3-D topography
analysis in the academic world and industry, and the commonly used
3-D parameters and plots for the characterizing and visualizing 3-D
surface topography.
It also includes new sections providing full treatment of surface
characterization, filtering technology and engineered surfaces, as
well as a fully updated bibliography.
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