New Horizons of Applied Scanning Electron Microscopy (Hardcover, 2010 ed.)

In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realized fully. This will take the reader to an entirely new level of scanning electron microscopy and finely-detailed images never seen before. Written for: Scientists, practitioners, academic libraries, graduate students

General

Imprint:	Springer-Verlag
Country of origin:	Germany
Series:	Springer Series in Surface Sciences, 45
Release date:	December 2009
First published:	2010
Authors:	Kenichi Shimizu • Tomoaki Mitani
Dimensions:	235 x 155 x 15mm (L x W x T)
Format:	Hardcover
Pages:	182
Edition:	2010 ed.
ISBN-13:	978-3-642-03159-5
Categories:	Books > Science & Mathematics > Science: general issues > Scientific equipment & techniques, laboratory equipment > Microscopy
LSN:	3-642-03159-5
Barcode:	9783642031595

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