Advanced Methods in Automatic Item Generation is an up-to-date
survey of the growing research on automatic item generation (AIG)
in today's technology-enhanced educational measurement sector. As
test administration procedures increasingly integrate digital media
and Internet use, assessment stakeholders-from graduate students to
scholars to industry professionals-have numerous opportunities to
study and create different types of tests and test items. This
comprehensive analysis offers thorough coverage of the theoretical
foundations and concepts that define AIG, as well as the practical
considerations required to produce and apply large numbers of
useful test items.
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