Modern Map Methods in Particle Beam Physics, Volume 108 (Hardcover)

Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

General

Imprint:	Academic Press Inc
Country of origin:	United States
Series:	Advances in Imaging and Electron Physics
Release date:	September 1999
First published:	1999
Series editors:	Peter W. Hawkes
Dimensions:	229 x 152 x 21mm (L x W x T)
Format:	Hardcover
Pages:	318
ISBN-13:	978-0-12-014750-2
Categories:	Books > Science & Mathematics > Physics > Optics (light) Books > Science & Mathematics > Physics > Particle & high-energy physics Books > Computing & IT > Applications of computing > Signal processing Books > Computing & IT > Applications of computing > Image processing > General Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Applied optics > General Books > Academic & Education > Professional & Technical > Physics
LSN:	0-12-014750-5
Barcode:	9780120147502

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