Physical Principles of Electron Microscopy - An Introduction to TEM, SEM, and AEM (Hardcover, 1st ed. 2005. Corr. 2nd printing 2011)

Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semi- conductor industry, nanotechnology and the biological, forensic, and medical sciences. This book provides an introduction to the theory and current practice of electron microscopy, aimed primarily at undergraduates who need to learn how the basic principles of physics are applied in an important area of science and technology that has contributed greatly to our knowledge of life processes and inner space. However, it will be equally valuable for technologists who make use of electron microscopes and for graduate students, university teachers and researchers who need a concise text that deals with the basic principles of microscopy. Less technical but broader in scope than other microscopy textbooks, Physical Principles of Electron Microscopy is appropriate for undergraduates and technologists with limited math...

General

Imprint:	Springer-Verlag New York
Country of origin:	United States
Release date:	February 2011
First published:	May 2008
Authors:	R.F. Egerton
Dimensions:	235 x 155 x 14mm (L x W x T)
Format:	Hardcover
Pages:	202
Edition:	1st ed. 2005. Corr. 2nd printing 2011
ISBN-13:	978-0-387-25800-3
Categories:	Books > Science & Mathematics > Science: general issues > Scientific equipment & techniques, laboratory equipment > Microscopy Promotions
LSN:	0-387-25800-0
Barcode:	9780387258003

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