Electron microscopy is now a mainstay characterization tool for
solid state physicists and chemists as well as materials
scientists. Containing the proceedings from the Electron Microscopy
and Analysis Group (EMAG) conference in September 2003, this volume
covers current developments in the field, primarily in the UK.
These conferences are biennial events organized by the EMAG of the
Institute of Physics to provide a forum for discussion of the
latest developments in instrumentation, techniques, and
applications of electron and scanning probe microscopies.
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