Overthe nearly 20 years of Kelvin probe force microscopy, an
increasing interest in the technique and its applications has
developed. This book gives a concise introduction into the method
and describes various experimental techniques. Surface potential
studies on semiconductor materials, nanostructures and devices are
described, as well as application to molecular and organic
materials. The current state of surface potential at the atomic
scale is also considered. This book presents an excellent
introduction for the newcomer to this field, as much as a valuable
resource for the expert."
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