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Introduction to Statistics in Metrology (Paperback, 1st ed. 2020)
Loot Price: R3,291
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Introduction to Statistics in Metrology (Paperback, 1st ed. 2020)
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This book provides an overview of the application of statistical
methods to problems in metrology, with emphasis on modelling
measurement processes and quantifying their associated
uncertainties. It covers everything from fundamentals to more
advanced special topics, each illustrated with case studies from
the authors' work in the Nuclear Security Enterprise (NSE). The
material provides readers with a solid understanding of how to
apply the techniques to metrology studies in a wide variety of
contexts. The volume offers particular attention to uncertainty in
decision making, design of experiments (DOEx) and curve fitting,
along with special topics such as statistical process control
(SPC), assessment of binary measurement systems, and new results on
sample size selection in metrology studies. The methodologies
presented are supported with R script when appropriate, and the
code has been made available for readers to use in their own
applications. Designed to promote collaboration between statistics
and metrology, this book will be of use to practitioners of
metrology as well as students and researchers in statistics and
engineering disciplines.
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