This special volume of "Advances in Imaging and Electron Physics
"details the current theory, experiments, and applications of
neutron and x-ray optics and microscopy for an international
readership across varying backgrounds and disciplines. Edited by
Dr. Ted Cremer, these volumes attempt to provide rapid assimilation
of the presented topics that include neutron and x-ray scatter,
refraction, diffraction, and reflection and their potential
application.
Key features:
* Contributions from leading authorities * Informs and updates
on all the latest developments in the field
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