"Modeling Nanoscale Imaging in Electron Microscopy" presents the
recent advances that have been made using mathematical methods to
resolve problems in microscopy. With improvements in hardware-based
aberration software significantly expanding the nanoscale imaging
capabilities of scanning transmission electron microscopes (STEM),
these mathematical models can replace some labor intensive
procedures used to operate and maintain STEMs. This book, the first
in its field since 1998, will also cover such relevant concepts as
superresolution techniques, special denoising methods, application
of mathematical/statistical learning theory, and compressed
sensing.
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