This book presents scanning electron microscopy (SEM)
fundamentals and applications for nanotechnology. It includes
integrated fabrication techniques using the SEM, such as e-beam and
FIB, and it covers in-situ nanomanipulation of materials. The book
is written by international experts from the top nano-research
groups that specialize in nanomaterials characterization. The book
will appeal to nanomaterials researchers, and to SEM development
specialists.
General
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