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Books > Science & Mathematics > Science: general issues > Scientific equipment & techniques, laboratory equipment > Microscopy

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Scanning Microscopy For Nanotechnology - Techniques And Applications (Hardcover, 2007 ed.) Loot Price: R6,803
Discovery Miles 68 030
Repayment Terms: R638 pm x 12*
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Scanning Microscopy For Nanotechnology - Techniques And Applications (Hardcover, 2007 ed.)

Weilie Zhou, Zhong Lin Wang

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Loot Price R6,803 Discovery Miles 68 030 | Repayment Terms: R638 pm x 12*

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This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.

General

Imprint: Springer-Verlag New York Inc.
Country of origin: United States
Release date: November 2006
First published: 2007
Editors: Weilie Zhou • Zhong Lin Wang
Dimensions: 238 x 155 x 25mm (L x W x T)
Format: Hardcover
Pages: 522
Edition: 2007 ed.
ISBN-13: 978-0-387-33325-0
Categories: Books > Science & Mathematics > Science: general issues > Scientific equipment & techniques, laboratory equipment > Microscopy
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LSN: 0-387-33325-8
Barcode: 9780387333250

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