Nanoscale Spectroscopy and Its Applications to Semiconductor Research (Hardcover, 2002 ed.)

Fabrication technologies for nanostructured devices have been developed recently, and the electrical and optical properties of such nanostructures are a subject of advanced research.This book describes the different approaches to spectroscopic microscopy, i.e., Electron Beam Probe Spectroscopy, Spectroscopic Photoelectron Microscopy, and Scanning Probe Spectroscopy. It will be useful as a compact source of reference for the experienced reseracher, taking into account at the same time the needs of postgraduate students and nonspecialist researchers by using a tutorial approach throughout.

General

Imprint:	Springer-Verlag
Country of origin:	Germany
Series:	Lecture Notes in Physics, 588
Release date:	July 2002
First published:	2002
Editors:	Y. Watanabe • S Heun • G. Salviati • N. Yamamoto
Dimensions:	235 x 155 x 24mm (L x W x T)
Format:	Hardcover
Pages:	308
Edition:	2002 ed.
ISBN-13:	978-3-540-43312-5
Categories:	Books > Science & Mathematics > Science: general issues > Scientific equipment & techniques, laboratory equipment > Microscopy Books > Science & Mathematics > Chemistry > Analytical chemistry > Qualitative analytical chemistry > Chemical spectroscopy, spectrochemistry > General
LSN:	3-540-43312-0
Barcode:	9783540433125

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