Dimensional metrology is an essential part of modern
manufacturing technologies, but the basic theories and measurement
methods are no longer sufficient for today's digitized systems. The
information exchange between the software components of a
dimensional metrology system not only costs a great deal of money,
but also causes the entire system to lose data integrity.
"Information Modeling for Interoperable Dimensional Metrology"
analyzes interoperability issues in dimensional metrology systems
and describes information modeling techniques. It discusses new
approaches and data models for solving interoperability problems,
as well as introducing process activities, existing and emerging
data models, and the key technologies of dimensional metrology
systems.
Written for researchers in industry and academia, as well as
advanced undergraduate and postgraduate students, this book gives
both an overview and an in-depth understanding of complete
dimensional metrology systems. By covering in detail the theory and
main content, techniques, and methods used in dimensional metrology
systems, "Information Modeling for Interoperable Dimensional
Metrology" enables readers to solve real-world dimensional
measurement problems in modern dimensional metrology practices.
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