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Books > Science & Mathematics > Chemistry > Analytical chemistry > Qualitative analytical chemistry > Chemical spectroscopy, spectrochemistry
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Secondary Ion Mass Spectrometry SIMS II - Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California, USA August 27-31, 1979 (Paperback, Softcover reprint of the original 1st ed. 1979)
Loot Price: R2,929
Discovery Miles 29 290
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Secondary Ion Mass Spectrometry SIMS II - Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California, USA August 27-31, 1979 (Paperback, Softcover reprint of the original 1st ed. 1979)
Series: Springer Series in Chemical Physics, 9
Expected to ship within 10 - 15 working days
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This volume contains the proceedings of the Tenth International
Converence on Secondary Ion Mass Spectrometry (SIMS X). It covers a
diverse field of research ranging from environmental problems to
depth profiling and semiconductors. In doing so, it provides an
excellent overview of current research and technology by
acknowledged experts in their specialised fields.
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