|
Books > Science & Mathematics > Chemistry > Analytical chemistry > Qualitative analytical chemistry > Chemical spectroscopy, spectrochemistry
|
Buy Now
Secondary Ion Mass Spectrometry SIMS II - Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California, USA August 27-31, 1979 (Paperback, Softcover reprint of the original 1st ed. 1979)
Loot Price: R2,960
Discovery Miles 29 600
|
|
|
Secondary Ion Mass Spectrometry SIMS II - Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California, USA August 27-31, 1979 (Paperback, Softcover reprint of the original 1st ed. 1979)
Series: Springer Series in Chemical Physics, 9
Expected to ship within 10 - 15 working days
|
This volume contains the proceedings of the Tenth International
Converence on Secondary Ion Mass Spectrometry (SIMS X). It covers a
diverse field of research ranging from environmental problems to
depth profiling and semiconductors. In doing so, it provides an
excellent overview of current research and technology by
acknowledged experts in their specialised fields.
General
Is the information for this product incomplete, wrong or inappropriate?
Let us know about it.
Does this product have an incorrect or missing image?
Send us a new image.
Is this product missing categories?
Add more categories.
Review This Product
No reviews yet - be the first to create one!
|
|
Email address subscribed successfully.
A activation email has been sent to you.
Please click the link in that email to activate your subscription.
Welcome to Loot.co.za!
Sign in / Register |Wishlists & Gift Vouchers |Help | Advanced search
