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Microscopy of Semiconducting Materials 2007 - Proceedings of the 15th Conference, 2-5 April 2007, Cambridge, UK (Hardcover, 2008 ed.)
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Microscopy of Semiconducting Materials 2007 - Proceedings of the 15th Conference, 2-5 April 2007, Cambridge, UK (Hardcover, 2008 ed.)
Series: Springer Proceedings in Physics, 120
Expected to ship within 10 - 15 working days
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This volume contains invited and contributed papers presented at
the conference on 'Microscopy of Semiconducting Materials' held at
the University of Cambridge on 2-5 April 2007. The event was
organised under the auspices of the Electron Microscopy and
Analysis Group of the Institute of Physics, the Royal Microscopical
Society and the Materials Research Society. This international
conference was the fifteenth in the series that focuses on the most
recent world-wide advances in semiconductor studies carried out by
all forms of microscopy and it attracted delegates from more than
20 countries. With the relentless evolution of advanced electronic
devices into ever smaller nanoscale structures, the problem
relating to the means by which device features can be visualised on
this scale becomes more acute. This applies not only to the imaging
of the general form of layers that may be present but also to the
determination of composition and doping variations that are
employed. In view of this scenario, the vital importance of
transmission and scanning electron microscopy, together with X-ray
and scanning probe approaches can immediately be seen. The
conference featured developments in high resolution microscopy and
nanoanalysis, including the exploitation of recently introduced
aberration-corrected electron microscopes. All associated imaging
and analytical techniques were demonstrated in studies including
those of self-organised and quantum domain structures. Many
analytical techniques based upon scanning probe microscopies were
also much in evidence, together with more general applications of
X-ray diffraction methods.
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