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Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > Semi-conductors & super-conductors

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Microscopy of Semiconducting Materials - Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK (Hardcover, 2005 ed.) Loot Price: R5,901
Discovery Miles 59 010
Repayment Terms: R553 pm x 12*
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Microscopy of Semiconducting Materials - Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK (Hardcover, 2005...

Microscopy of Semiconducting Materials - Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK (Hardcover, 2005 ed.)

A.G. Cullis, John L. Hutchison

Series: Springer Proceedings in Physics, 107

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Loot Price R5,901 Discovery Miles 59 010 | Repayment Terms: R553 pm x 12*

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The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction.

General

Imprint: Springer-Verlag
Country of origin: Germany
Series: Springer Proceedings in Physics, 107
Release date: April 2006
First published: 2005
Editors: A.G. Cullis • John L. Hutchison
Dimensions: 235 x 155 x 30mm (L x W x T)
Format: Hardcover
Pages: 540
Edition: 2005 ed.
ISBN-13: 978-3-540-31914-6
Categories: Books > Science & Mathematics > Science: general issues > Scientific equipment & techniques, laboratory equipment > Microscopy
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > Semi-conductors & super-conductors
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LSN: 3-540-31914-X
Barcode: 9783540319146

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