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The Physics and Chemistry of SiO2 and the Si-SiO2 Interface 2 (Paperback, Softcover reprint of the original 1st ed. 1993) Loot Price: R5,770
Discovery Miles 57 700
The Physics and Chemistry of SiO2 and the Si-SiO2 Interface 2 (Paperback, Softcover reprint of the original 1st ed. 1993): B.E....

The Physics and Chemistry of SiO2 and the Si-SiO2 Interface 2 (Paperback, Softcover reprint of the original 1st ed. 1993)

B.E. Deal, C.R. Helms

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Loot Price R5,770 Discovery Miles 57 700 | Repayment Terms: R541 pm x 12*

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The first international symposium on the subject "The Physics and Chemistry of Si02 and the Si-Si02 Interface," organized in association with the Electrochemical Society, Inc. , was held in Atlanta, Georgia on May 15- 20, 1988. This symposium contained sixty papers and was so successful that the sponsoring divisions decided to schedule it on a regular basis every four years. Thus, the second symposium on "The Physics and Chemistry of Si02 and the Si02 Interface was held May 18-21, 1992 in St. Louis, Missouri, again sponsored by the Electronics and Dielectrics Science and Technology Divisions of The Electrochemical Society. This volume contains manuscripts of most of the fifty nine papers presented at the 1992 symposium, and is divided into eight chapters - approximating the organization of the symposium. Each chapter is preceded with an introduction by the session organizers. It is appropriate to provide a general assessment of the current status and understanding of the physics and chemistry of Si02 and the Si02 interface before proceeding with a brief overview of the individual chapters. Semiconductor devices have continued to scale down in both horizontal and vertical dimensions. This has resulted in thinner gate and field oxides as well as much closer spacing of individual device features. As a result, surface condition, native oxide composition, and cleaning and impurity effects now provide a much more significant contribution to the properties of oxides and their interfaces.

General

Imprint: Springer-Verlag New York
Country of origin: United States
Release date: November 2013
First published: 1993
Editors: B.E. Deal • C.R. Helms
Dimensions: 235 x 155 x 27mm (L x W x T)
Format: Paperback
Pages: 503
Edition: Softcover reprint of the original 1st ed. 1993
ISBN-13: 978-1-4899-1590-0
Categories: Books > Science & Mathematics > Chemistry > Physical chemistry > Electrochemistry & magnetochemistry
Books > Professional & Technical > Energy technology & engineering > Electrical engineering > General
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > General
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LSN: 1-4899-1590-7
Barcode: 9781489915900

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