Scanning Probe Microscopy - Atomic Force Microscopy and Scanning Tunneling Microscopy (Hardcover, 2015 ed.)

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.

General

Imprint:	Springer-Verlag
Country of origin:	Germany
Series:	NanoScience and Technology
Release date:	March 2015
First published:	2015
Authors:	Bert Voigtlander
Dimensions:	235 x 155 x 26mm (L x W x T)
Format:	Hardcover
Pages:	382
Edition:	2015 ed.
ISBN-13:	978-3-662-45239-4
Categories:	Books > Professional & Technical > Technology: general issues > Nanotechnology Books > Science & Mathematics > Physics > States of matter > General Books > Professional & Technical > Industrial chemistry & manufacturing technologies > Other manufacturing technologies > Precision instruments manufacture > General
LSN:	3-662-45239-1
Barcode:	9783662452394

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