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Books > Professional & Technical > Technology: general issues > Nanotechnology
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Scanning Probe Microscopy - Atomic Force Microscopy and Scanning Tunneling Microscopy (Hardcover, 2015 ed.)
Loot Price: R4,421
Discovery Miles 44 210
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Scanning Probe Microscopy - Atomic Force Microscopy and Scanning Tunneling Microscopy (Hardcover, 2015 ed.)
Series: NanoScience and Technology
Expected to ship within 12 - 17 working days
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This book explains the operating principles of atomic force
microscopy and scanning tunneling microscopy. The aim of this book
is to enable the reader to operate a scanning probe microscope
successfully and understand the data obtained with the microscope.
The chapters on the scanning probe techniques are complemented by
the chapters on fundamentals and important technical aspects. This
textbook is primarily aimed at graduate students from physics,
materials science, chemistry, nanoscience and engineering, as well
as researchers new to the field.
General
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