Applied Scanning Probe Methods I (Hardcover, 2004 ed.)

This volume examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After laying the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM. Scientists and engineers either using or planning to use SPM techniques will benefit from the international perspective assembled in the book.

General

Imprint:	Springer-Verlag
Country of origin:	Germany
Series:	NanoScience and Technology
Release date:	March 2004
First published:	2004
Editors:	Bharat Bhushan • Harald Fuchs • Sumio Hosaka
Dimensions:	235 x 155 x 27mm (L x W x T)
Format:	Hardcover
Pages:	476
Edition:	2004 ed.
ISBN-13:	978-3-540-00527-8
Categories:	Books > Science & Mathematics > Science: general issues > Scientific equipment & techniques, laboratory equipment > Microscopy Books > Professional & Technical > Technology: general issues > Instruments & instrumentation engineering > General Books > Professional & Technical > Mechanical engineering & materials > Materials science > General
LSN:	3-540-00527-7
Barcode:	9783540005278

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