Scanning Probe Microscopy in Nanoscience and Nanotechnology 2 (Paperback, Softcover reprint of the original 1st ed. 2011)

This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

General

Imprint:	Springer-Verlag
Country of origin:	Germany
Series:	NanoScience and Technology
Release date:	August 2016
Editors:	Bharat Bhushan
Dimensions:	235 x 155 x 42mm (L x W x T)
Format:	Paperback
Pages:	816
Edition:	Softcover reprint of the original 1st ed. 2011
ISBN-13:	978-3-662-50601-1
Categories:	Books > Professional & Technical > Technology: general issues > Nanotechnology Books > Science & Mathematics > Physics > States of matter > General Books > Science & Mathematics > Physics > Applied physics & special topics > Biophysics Books > Professional & Technical > Industrial chemistry & manufacturing technologies > Other manufacturing technologies > Precision instruments manufacture > General Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials > General
LSN:	3-662-50601-7
Barcode:	9783662506011

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