Secondary Ion Mass Spectroscopy of Solid Surfaces (Hardcover)

This volume is devoted to the physics, instrumentation and analytical methods of secondary ion mass spectroscopy (SIMS) in relation to solid surfaces. It describes modern models of secondary ion formation and the factors influencing sensitivity of measurements and the range of applications. All the main parts of SIMS instruments are discussed in detail. Emphasising practical applications the book also considers the methods and analytical procedures for constitutional analysis of solids --- including metals, semiconductors, organic and biological samples. Methods of depth profiling, spatially multidimensional analysis and study of processes at the surface, such as adsorption, catalysis and oxidation, are given along with the application of SIMS in combination with other methods of surface analysis.

General

Imprint:	VSP International Science Publishers
Country of origin:	Netherlands
Release date:	December 1987
First published:	1987
Editors:	Cherepin
Dimensions:	234 x 156 x 14mm (L x W x T)
Format:	Hardcover
Pages:	138
ISBN-13:	978-90-6764-078-7
Categories:	Books > Science & Mathematics > Chemistry > Analytical chemistry > Qualitative analytical chemistry > Chemical spectroscopy, spectrochemistry > General Promotions
LSN:	90-6764-078-6
Barcode:	9789067640787

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