Scanning Tunneling Microscopy and Its Application (Hardcover, 2nd rev. ed. 2000)

Scanning Tunneling Microscopy and its Application presents a unified view of the rapidly growing field of STM,and its many derivatives. A thorough discussion of the various principles provides the background to tunneling phenomena and leads to the many novel scanning-probe techniques, such as AFM, MFM, BEEM, PSTM, etc. After having examined the available instrumentation and the methods for tip and surface preparations, the monograph provides detailed accounts of STM application to metal and semiconductor surfaces, adsorbates and surface chemistry, biology, and nanofabrication. It examines limitations of the present-day investigations and provides hints about possible further trends. This second edition includes important new developments in the field.

General

Imprint:	Springer-Verlag
Country of origin:	Germany
Series:	Springer Series in Surface Sciences, 32
Release date:	August 2000
First published:	2000
Authors:	Chunli Bai
Dimensions:	234 x 156 x 22mm (L x W x T)
Format:	Hardcover
Pages:	370
Edition:	2nd rev. ed. 2000
ISBN-13:	978-3-540-65715-6
Categories:	Books > Science & Mathematics > Physics > Optics (light) Books > Professional & Technical > Mechanical engineering & materials > General Books > Science & Mathematics > Science: general issues > Scientific equipment & techniques, laboratory equipment > Microscopy
LSN:	3-540-65715-0
Barcode:	9783540657156

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