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Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > Semi-conductors & super-conductors

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X-Ray Absorption Spectroscopy of Semiconductors (Paperback, Softcover reprint of the original 1st ed. 2015) Loot Price: R3,610
Discovery Miles 36 100
X-Ray Absorption Spectroscopy of Semiconductors (Paperback, Softcover reprint of the original 1st ed. 2015): Claudia S....

X-Ray Absorption Spectroscopy of Semiconductors (Paperback, Softcover reprint of the original 1st ed. 2015)

Claudia S. Schnohr, Mark C. Ridgway

Series: Springer Series in Optical Sciences, 190

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Loot Price R3,610 Discovery Miles 36 100 | Repayment Terms: R338 pm x 12*

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X-ray Absorption Spectroscopy (XAS) is a powerful technique with which to probe the properties of matter, equally applicable to the solid, liquid and gas phases. Semiconductors are arguably our most technologically-relevant group of materials given they form the basis of the electronic and photonic devices that now so widely permeate almost every aspect of our society. The most effective utilisation of these materials today and tomorrow necessitates a detailed knowledge of their structural and vibrational properties. Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field. A short introduction of the technique, aimed primarily at XAS newcomers, is followed by twenty independent chapters dedicated to distinct groups of materials. Topics span dopants in crystalline semiconductors and disorder in amorphous semiconductors to alloys and nanometric material as well as in-situ measurements of the effects of temperature and pressure. Summarizing research in their respective fields, the authors highlight important experimental findings and demonstrate the capabilities and applications of the XAS technique. This book provides a comprehensive review and valuable reference guide for both XAS newcomers and experts involved in semiconductor materials research.

General

Imprint: Springer-Verlag
Country of origin: Germany
Series: Springer Series in Optical Sciences, 190
Release date: August 2016
First published: 2015
Editors: Claudia S. Schnohr • Mark C. Ridgway
Dimensions: 235 x 155 x 20mm (L x W x T)
Format: Paperback
Pages: 361
Edition: Softcover reprint of the original 1st ed. 2015
ISBN-13: 978-3-662-52212-7
Categories: Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > Semi-conductors & super-conductors
Books > Science & Mathematics > Chemistry > Analytical chemistry > Qualitative analytical chemistry > Chemical spectroscopy, spectrochemistry > General
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LSN: 3-662-52212-8
Barcode: 9783662522127

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