High-Resolution Electron Microscopy for Materials Science (Paperback, Softcover reprint of the original 1st ed. 1998)

High-resolution electron microscopy (HREM) has become a most powerful method for investigating the internal structure of materials on an atomic scale of around 0.1 nm. The authors clearly explain both the theory and practice of HREM for materials science. In addition to a fundamental formulation of the imaging process of HREM, there is detailed explanation of image simulationindispensable for interpretation of high-resolution images. Essential information on appropriate imaging conditions for observing lattice images and structure images is presented, and methods for extracting structural information from these observations are clearly shown, including examples in advanced materials. Dislocations, interfaces, and surfaces are dealt with, and materials such as composite ceramics, high-Tc superconductors, and quasicrystals are also considered. Included are sections on the latest instruments and techniques, such as the imaging plate and quantitative HREM.

General

Imprint:	Springer Verlag,Japan
Country of origin:	Japan
Release date:	2001
First published:	1998
Authors:	Daisuke Shindo • Hiraga Kenji
Dimensions:	280 x 210 x 16mm (L x W x T)
Format:	Paperback
Pages:	190
Edition:	Softcover reprint of the original 1st ed. 1998
ISBN-13:	978-4-431-70234-4
Categories:	Books > Science & Mathematics > Science: general issues > Scientific equipment & techniques, laboratory equipment > Microscopy Books > Professional & Technical > Mechanical engineering & materials > Materials science > General Promotions
LSN:	4-431-70234-2
Barcode:	9784431702344

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