Structural Analysis of Point Defects in Solids - An Introduction to Multiple Magnetic Resonance Spectroscopy (Paperback, Softcover reprint of the original 1st ed. 1992)

Strutural Analysis of Point Defects in Solids introduces the principles and techniques of modern electron paramagnetic resonance (EPR) spectroscopy essentialfor applications to the determination of microscopic defect structures. Investigations of the microscopic and electronic structure, and also correlations with the magnetic propertiesof solids, require various multiple magnetic resonance methods, such as ENDOR and optically detected EPR or ENDOR. This book discusses experimental, technological and theoretical aspects of these techniques comprehensively, from a practical viewpoint, with many illustrative examples taken from semiconductors and other solids. The nonspecialist is informed about the potential of the different methods, while the researcher faced with the task of determining defect structures isprovided with the necessary tools, together with much information on computer-aided methods of data analysis and the principles of modern spectrometer design.

General

Imprint:	Springer-Verlag
Country of origin:	Germany
Series:	Springer Series in Solid-State Sciences, 43
Release date:	2012
First published:	1992
Authors:	Johann-Martin Spaeth • J urgen R Niklas • Ralph H. Bartram
Dimensions:	235 x 155 x 20mm (L x W x T)
Format:	Paperback
Pages:	367
Edition:	Softcover reprint of the original 1st ed. 1992
ISBN-13:	978-3-642-84407-2
Categories:	Books > Science & Mathematics > Physics > States of matter > General Books > Science & Mathematics > Chemistry > Physical chemistry > Quantum & theoretical chemistry
LSN:	3-642-84407-3
Barcode:	9783642844072

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