Sampling, Wavelets, and Tomography (Paperback, Softcover reprint of the original 1st ed. 2004)

Sampling, wavelets, and tomography are three active areas of contemporary mathematics sharing common roots that lie at the heart of harmonic and Fourier analysis. The advent of new techniques in mathematical analysis has strengthened their interdependence and led to some new and interesting results in the field. This state-of-the-art book not only presents new results in these research areas, but it also demonstrates the role of sampling in both wavelet theory and tomography. Specific topics covered include: * Robustness of Regular Sampling in Sobolev Algebras * Irregular and Semi-Irregular Weyl-Heisenberg Frames * Adaptive Irregular Sampling in Meshfree Flow Simulation * Sampling Theorems for Non-Bandlimited Signals * Polynomial Matrix Factorization, Multidimensional Filter Banks, and Wavelets * Generalized Frame Multiresolution Analysis of Abstract Hilbert Spaces * Sampling Theory and Parallel-Beam Tomography * Thin-Plate Spline Interpolation in Medical Imaging * Filtered Back-Projection Algorithms for Spiral Cone Computed Tomography Aimed at mathematicians, scientists, and engineers working in signal and image processing and medical imaging, the work is designed to be accessible to an audience with diverse mathematical backgrounds. Although the volume reflects the contributions of renowned mathematicians and engineers, each chapter has an expository introduction written for the non-specialist. One of the key features of the book is an introductory chapter stressing the interdependence of the three main areas covered. A comprehensive index completes the work. Contributors: J.J. Benedetto, N.K. Bose, P.G. Casazza, Y.C. Eldar, H.G. Feichtinger, A. Faridani, A. Iske, S. Jaffard, A. Katsevich, S. Lertrattanapanich, G. Lauritsch, B. Mair, M. Papadakis, P.P. Vaidyanathan, T. Werther, D.C. Wilson, A.I. Zayed

General

Imprint:	Springer-Verlag New York
Country of origin:	United States
Series:	Applied and Numerical Harmonic Analysis
Release date:	December 2012
First published:	2004
Editors:	John J. Benedetto • Ahmed I. Zayed
Dimensions:	235 x 155 x 19mm (L x W x T)
Format:	Paperback
Pages:	344
Edition:	Softcover reprint of the original 1st ed. 2004
ISBN-13:	978-1-4612-6495-8
Categories:	Books > Science & Mathematics > Mathematics > Calculus & mathematical analysis > Complex analysis Books > Science & Mathematics > Mathematics > Calculus & mathematical analysis > Vector & tensor analysis Books > Science & Mathematics > Mathematics > Applied mathematics > Mathematics for scientists & engineers Books > Computing & IT > Applications of computing > Image processing > General Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Applied optics > General
LSN:	1-4612-6495-2
Barcode:	9781461264958

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