A powerful and relatively new method for extracting detailed crystal structural information from X-ray and neutron powder diffraction data, the Rietveld method attracts a great deal of interest from researchers in physics, chemistry, materials science, and crystallography. Now available in paperback, this book comprises chapters from international researchers on all aspects of this important technique. It will be of great interest to all researchers in the fields, as well as graduate students seeking a solid introduction and comprehensive survey.
Contributors: R. A. Young (Georgia Institute of Technology, Atlanta, USA); H. M. Rietveld (Netherlands Energy Research Foundation); E. Prince (National Institute of Standards and Technology, Gaithersburg); T. M. Sabine (University of Technology, Broadway); R. J. Hill (CSIRO Divisionof Mineral Products, Port Melbourne); J. W. Richardson Jr. (Argonne National Laboratory, Argonne); R. L. Snyder (New York State College of Ceramics, USA); R. Delhez, Th. H. de Keijser, E. J. Mittemeijer, and E. J. Sonneveld (Laboratory of Metallurgy, Delft University of Technology); J. I. Langford (University of Birmingham, UK); D. Louër (Université de Rennes, France); P. Suortti (ESRF, Grenoble, Switzerland); C. Bärlocher (ETH Zentrum, Zürich); W. I. F. David (Rutherford Appleton Laboratory, UK); J. D. Jorgensen (Argonne National Laboratory, Argonne); R. B. von Dreele (Los Alamos National Laboratory, USA); F. Izumi (National Institute for Research in Inorganic Materials, Tsukuba, Japan); H. Toraya (Nagoya Institute of Technology, Asahigaoka); A. K. Cheetham (University of California, Santa Barbara, USA)
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